Ellipsometry is an optical technique devoted to the analysis of surfaces. It is based on the measurement of the variation of the polarizationstate of light after reflection on a plane surface. The strong advantages of ellipsometry are its non destructive character and easiness of preparation of samples for analysis.

The system installed at CINN allows performing other additional optical and magneto-optical characterizations such as optical transmittance and Kerr and Farady analysis.

Since 2009, CINN has used ellipsometry and related optical and magneto-optical techniques for the study of a wide variety of materials, both as thin films: metals, semiconductos, dielectrics and bulk materials: dielectrics, metals, composites, ferromagnetics…