Electromagnetic Characterization
The CINN electromagnetic characterization service is aimed at the optical, magneto-optical and dielectric characterization of materials such as thin films (metals, semiconductors, dielectrics) and dense materials: dielectrics, metals, composite materials, ferromagnetics..
Location
Avda. de la Vega, 4 – 6
33940. El Entrego – España
Equipment
The laboratory is equipped with a complex impedance spectroscopy equipment Mod. Newton N4, a full-size vector network analyzer Mod. PLANAR 804/1 and an a SOPRA GES-5E ellipsometer that allows not only to perform optical characterizations but also to analyse other magneto-optical parameters such as optical transmittance and Kerr and Faraday analysis.
Ellipsometer Mod. SOPRA GES-5E
Impedance analyzer + Network vector analyzer
Services Offered
Ellipsometry is an optical technique devoted to the analysis of surfaces. It is based on the measurement of the variation of the polarizationstate of light after reflection on a plane surface. The strong advantages of ellipsometry are its non destructive character and easiness of preparation of samples for analysis.
The system installed at CINN allows performing other additional optical and magneto-optical characterizations such as optical transmittance and Kerr and Farady analysis.
Since 2009, CINN has used ellipsometry and related optical and magneto-optical techniques for the study of a wide variety of materials, both as thin films: metals, semiconductos, dielectrics and bulk materials: dielectrics, metals, composites, ferromagnetics…
Dielectric characterization can be performed between 0.1Hz and 8 GHz using an impedance analyzer + vector network analyzer.
Magneto-optical characterization (transverse Kerr effect) between 190 nm and 1.9 microns.
Conductivity measurements between 0.1Hz y 8 GHz
Apply
To request any of the services, please download and fill in the Application Form and send it to the following email address (jl.menendez@cinn.es). We will contact you as soon as possible